The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Aug. 07, 2003
Kohji Sakai, Tokyo, JP;
Magane Aoki, Yokosuka, JP;
Yoshinori Hayashi, Kawasaki, JP;
Seizo Suzuki, Yokohama, JP;
Hiromichi Atsuumi, Yokohama, JP;
Kohji Sakai, Tokyo, JP;
Magane Aoki, Yokosuka, JP;
Yoshinori Hayashi, Kawasaki, JP;
Seizo Suzuki, Yokohama, JP;
Hiromichi Atsuumi, Yokohama, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A multi-beam optical scanning apparatus includes a semiconductor laser array slanted relative to a sub-scanning direction and emitting a plurality of optical beams; a coupling lens converting a shape of each optical beam emitted from the semiconductor laser array; and an aperture with an opening having a size of A×A, arranged after the coupling lens in a direction in which the optical beam progresses, where Ais a dimension of the opening in a main scanning direction and Ais a dimension of the opening in the sub-scanning direction. When a length in the main scanning direction of a contour line defined by 1/estrength of a maximum strength of an optical beam at the position of the aperture is L, and a length in the sub-scanning direction of the contour line defined by 1/estrength of the maximum strength of the optical beam at the position of the aperture is L, the following conditional expressions are satisfied:A<L, and  (1)×0.3<×1.7.  (2)