The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Mar. 09, 2004
Craig L. Schimmel, Albuquerque, NM (US);
Craig L. Schimmel, Albuquerque, NM (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
The generation of contour plot images from elevation data in real time for use in a digital moving map. The contour line interval is dynamically selectable. The elevation data is scanned in 2 dimensions simultaneously, but in a single pass. As the elevation data is scanned for the given contour line interval, a history is maintained of the contour line elevation state in both dimensions. At any point, only comparisons against the two historical values are required to determine if a point on a contour line exists.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile