The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2006

Filed:

Mar. 15, 2000
Applicants:

Kent Allan Franklin, Appleton, WI (US);

Henry L. Carbone, Appleton, WI (US);

David P. Hunter, Appleton, WI (US);

Robert Lee Popp, Hortonville, WI (US);

Gregory M. Blincoe, Appleton, WI (US);

Christopher S. Larsen, Wisconsin Rapids, WI (US);

Inventors:

Kent Allan Franklin, Appleton, WI (US);

Henry L. Carbone, Appleton, WI (US);

David P. Hunter, Appleton, WI (US);

Robert Lee Popp, Hortonville, WI (US);

Gregory M. Blincoe, Appleton, WI (US);

Christopher S. Larsen, Wisconsin Rapids, WI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 15/20 (2006.01); B26D 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A closed-loop system can maintain a pre-set cut length of a material as the material is cut and placed on a web. The system has the ability to measure the actual cut length, compare the average actual cut length to a target cut length, and to adjust web tension or feed roll speed to achieve the target cut length. Actual cut length variation is thereby reduced. Furthermore, short term cut length variation is further reduced by minimizing the tension of the web just prior to the material being cut.


Find Patent Forward Citations

Franklin, Kent. (2006). System for measuring and controlling cut length of discrete components in a high-speed process (U.S. Patent No. 7004053). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7004053

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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