The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2006

Filed:

May. 12, 2003
Applicants:

Jun Zhou, Poughkeepsie, NY (US);

David J. Hathaway, Underhill Center, VT (US);

Chandramouli Visweswariah, Croton-on-Hudson, NY (US);

Patrick M. Williams, Poughkeepsie, NY (US);

Inventors:

Jun Zhou, Poughkeepsie, NY (US);

David J. Hathaway, Underhill Center, VT (US);

Chandramouli Visweswariah, Croton-on-Hudson, NY (US);

Patrick M. Williams, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method for enhanced efficiency and effectiveness in achieving timing closure of large, complex, high-performance digital integrated circuits. Circuit macros are re-optimized and re-tuned in the timing closure loop by means of a reformulated objective function that allows the optimizer to improve the slack of all signals rather than just the most critical one(s). The incentive to improve the timing of a sub-critical signal is a diminishing function of the criticality of the signal. Thus all signals are improved during the optimization, with the highest incentive to improve on the most critical signals, leading to faster and more effective overall timing closure.


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