The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2006
Filed:
Nov. 30, 1999
James Wichelman, Fort Collins, CO (US);
Bruce Votipka, Fort Collins, CO (US);
Eric N. Flink, Loveland, CO (US);
Craig Chamberlain, Louisville, CO (US);
James Wichelman, Fort Collins, CO (US);
Bruce Votipka, Fort Collins, CO (US);
Eric N. Flink, Loveland, CO (US);
Craig Chamberlain, Louisville, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A channel plan with a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan enables a monitoring system to, among other things, conduct automatic periodic test plans, comprising tests, on the nodes, based upon the predefined data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes as a whole and/or to one or more channels contained within the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller controlling the switch and the spectrum analyzer. The controller is configured to enable creation of and display the channel plan and test plan, based upon user inputs. Notably, the controller can be configured to compare results from tests with alarm limits, specified in the test plan, to control the spectrum analyzer to perform a failure time spectrum scan when one or more test results exceed one or more alarm limits, and to generate a plot of power amplitude versus frequency over the frequency spectrum of the node at issue.