The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2006

Filed:

Mar. 15, 2005
Applicant:

S. Mark Haugland, Houston, TX (US);

Inventor:

S. Mark Haugland, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/18 (2006.01); G01V 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus are provided for adjusting electromagnetic well logging data for effects of frequency dispersion. In exemplary embodiments, a model is provided for estimating an electrical property of an earth formation as a function of frequency. The model is derived, for each particular volume of interest, based on measured data obtained by employing a plurality of interrogation frequencies. Measured data may include electrical properties of the volume of interest such as conductivity and dielectric constant. The model predicts the measurements expected to be obtained by a tool employing a selected interrogation frequency, including frequencies for which no measured data are available. In one embodiment, the model may be used to adjust measured data for effects of frequency dispersion to correspond to a selected interrogation frequency, allowing the adjusted data to be more effectively correlated to logging data obtained by a different type of tool employing a different interrogation frequency.


Find Patent Forward Citations

Loading…