The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2006
Filed:
Oct. 06, 2003
Raymond Mark Bell, Jr., Redwood City, CA (US);
Patrick Elliott Perkins, Sunnyvale, CA (US);
Lawrence Lowell Ames, San Jose, CA (US);
William Walter Anderson, Half Moon Bay, CA (US);
Raymond Mark Bell, Jr., Redwood City, CA (US);
Patrick Elliott Perkins, Sunnyvale, CA (US);
Lawrence Lowell Ames, San Jose, CA (US);
William Walter Anderson, Half Moon Bay, CA (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
Techniques for measuring spatial locations. An apparatus for measuring spatial locations includes a first object at a first location, a second object at a second location, and a waveguide-based interferometer coupled between the first object and the second object. The waveguide-based interferometer includes a waveguide material. The waveguide material is adapted to carry at least a reference beam and a measurement beam. The reference beam traverses a first path defined within the waveguide material. The measurement beam traverses a second path defined within the waveguide material and a third path defined outside of the waveguide material. The third path is related to at least one of the first location and the second location.