The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2006

Filed:

Sep. 26, 2002
Applicants:

William C. Walton, Severn, MD (US);

Cash J. Costello, Columbia, MD (US);

Elissa M. Weidaw, Reston, VA (US);

Inventors:

William C. Walton, Severn, MD (US);

Cash J. Costello, Columbia, MD (US);

Elissa M. Weidaw, Reston, VA (US);

Assignee:

The John Hopkins University, Baltimore, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method of automatically creating a NIMA certified line drawing from a National Imagery Transmission Format (NITF) image file. A grayscale (electro-optical) image and its associated metadata from a NITF file is input into the computer based system. Pre-screening operations are performed on the metadata prior to image processing to ensure that National Imagery and Mapping Agency (NIMA) requirements and criteria are met. Image processing algorithms then perform filtering, encoding, edge detection, and custom edge pattern classification procedures to create a declassified line drawing. The line drawing can then be saved in any number of standard commercial file formats.


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