The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2006
Filed:
Mar. 12, 2003
Cheewai Lum, Singapore, SG;
Lingling Chua, Singapore, SG;
Kokchoon See, Singapore, SG;
Seagate Technology, LLC, Scotts Valley, CA (US);
Abstract
A smart retry operation, or set of retry procedures to be performed in sequence, that optimizes itself for a data storage device's individual characteristics, including variations across the data storage media and variations introduced as the device degrades over time, is disclosed. The data storage media (e.g. a disc in a disc drive) is divided into a number of zones and a separate smart retry operation is maintained for each zone. The data storage media is then tested to find errors correctable by the retry procedures. A statistical likelihood for each retry procedure is developed. The sequential order of the retry procedures in each zone's operation is then optimized based on the statistics. A single read/write retry sequences or separate read and write retry sequences may be maintained. The retry operations may be constantly re-optimized over the lifetime of the data storage device.