The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2006

Filed:

Apr. 10, 2000
Applicants:

Edward J Van Liew, Oceanside, CA (US);

Nobuko M Nathan, Encinitas, CA (US);

Birsen Ulupinar, La Jolla, CA (US);

Inventors:

Edward J Van Liew, Oceanside, CA (US);

Nobuko M Nathan, Encinitas, CA (US);

Birsen Ulupinar, La Jolla, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); G06K 15/02 (2006.01); H04N 1/40 (2006.01); G06F 3/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A forensic marking system and method for identifying the printing device on which a medium was printed. Encoded forensic markings which identify the device but are of low perceptibility to the human eye are superimposed on the printed image. The markings have a color, size, density, and repetition pattern that only minimally affect print quality while providing highly accurate identification of the printing device, even if the printed medium contains high-density image content.


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