The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2006
Filed:
Jun. 10, 2003
Kenichi Akao, Hachioji, JP;
Jun Koshoubu, Hachioji, JP;
Kenichi Akao, Hachioji, JP;
Jun Koshoubu, Hachioji, JP;
Jasco Corporation, Tokyo, JP;
Abstract
The object of the invention is to provide an infrared circular dichroism measuring apparatus that improves the measuring time and the measuring accuracy. An infrared circular dichroism measuring apparatuscomprising: AC signal extractorswhere an interference light beam from an IR light sourcewhich has passed an interferometeris converted into a clockwise and a counterclockwise circularly polarized light beams and is irradiated on a sample to extract from a detected signal of detectoran interferogram by each of the circularly polarized light beams; DC signal extractorsfor extracting an interferogram by the IR absorption of the sample; a calculatorfor figuring out the circular dichroism; and a selective transmitterfor narrowing down the wavelength region to be measured based on an IR absorption wavelength region corresponding to a vibration mode of the structure to be measured in the sample molecule.