The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2006
Filed:
Jun. 30, 2004
Alexander Schaepman, Breda, NL;
Vincent Bons, Geldrop, NL;
Paulus C. J. M. Hendrickx, Baarle-Nassau, NL;
Jozef A. W. M. Corver, Nuenen, NL;
Alexander Schaepman, Breda, NL;
Vincent Bons, Geldrop, NL;
Paulus C. J. M. Hendrickx, Baarle-Nassau, NL;
Jozef A. W. M. Corver, Nuenen, NL;
The BOC Group, Inc., Murray Hill, NJ (US);
Abstract
A method () permits determining the temperature in a magnetic resonance check weighing system () of a sample in a container () on a production line at the time of magnetic resonance testing. Method () includes the steps of determining a time-temperature correction factor for the sample in the container (), measuring the temperature of the composite sample and the container at a time other than the time of magnetic resonance testing (), and applying the correction factor to the temperature of the composite sample and container at a time other than the time of magnetic resonance testing ().