The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2006

Filed:

Mar. 02, 2004
Applicant:

Andreas Lubbertus Aloysius Johannes Dekker, Maastricht, NL;

Assignee:

Datex-Ohmeda, Inc., Madison, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus are disclosed for using photoplethysmography to obtain physiological parameter information related to respiration rate, heart rate, heart rate variability, blood volume variability and/or the autonomic nervous system. In one implementation, the process involves obtaining () a pleth, filtering () the pleth to remove unwanted components, identifying () a signal component of interest, monitoring () blood pressure changes, monitoring () heart rate, and performing () an analysis of the blood pressure signal to the heart rate signal to identify a relationship associated with the component of interest. Based on this relationship, the component of interest may be identified () as relating to the respiration or Mayer Wave. If it is related to the respiration wave (), a respiratory parameter such as breathing rate may be determined (). Otherwise, a Mayer Wave analysis () may be performed to obtain parameter information related to the autonomic nervous system.


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