The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2006
Filed:
Sep. 03, 2002
Claus Schneider, Bubenreuth, DE;
Ralph Trunk, Bischberg, DE;
Lothar Pfitzner, Erlangen, DE;
Heinz Schmid, Erlangen, DE;
Claus Schneider, Bubenreuth, DE;
Ralph Trunk, Bischberg, DE;
Lothar Pfitzner, Erlangen, DE;
Heinz Schmid, Erlangen, DE;
Infineon Technologies AG, Munich, DE;
Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung E.V., Munich, DE;
Abstract
A particle measurement configuration measures the particle concentration in a liquid or gaseous medium by way of a particle measuring instrument. In order to avoid erroneous measurements or damage to the particle measuring instrument, a measuring cell is provided which measures temperature or pressure or pH of the medium. A system controller shuts off a valve if threshold values are exceeded and it prevents the particle measuring instrument from being operated outside a predefined specification.