The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Apr. 13, 2000
Theodore M. Osborne, Ii, Burlington, MA (US);
Michael V. Glik, Newton, MA (US);
Caren H. Baker, Waltham, MA (US);
George Friedman, Framingham, MA (US);
Walter G. Vahey, Winchester, MA (US);
Theodore M. Osborne, II, Burlington, MA (US);
Michael V. Glik, Newton, MA (US);
Caren H. Baker, Waltham, MA (US);
George Friedman, Framingham, MA (US);
Walter G. Vahey, Winchester, MA (US);
Empirix Inc., Bedford, MA (US);
Abstract
A system for testing middleware of applications in the N-tiered model. The test system contains test code generators, test engines to execute multiple copies of the test code and a data analyzer to analyze and present the results to a human user. The system is able to automatically generate test code to exercise components of the middleware using information about these components that would otherwise be available to the application under test. Multiple copies of the test code are executed in a synchronized fashion. Execution times of multiple events are recorded and then presented in one of several formats. With the system, an application developer can identify components that represent performance bottlenecks or can gather information on deployment properties of individual components that can be used to enhance the performance of the application under test.