The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Jan. 30, 2002
Applicants:

Joseph R. Siegel, Shrewsbury, MA (US);

David J. Greenhill, Portola Valley, CA (US);

Ban-pak Wong, Milpitas, CA (US);

Inventors:

Joseph R. Siegel, Shrewsbury, MA (US);

David J. Greenhill, Portola Valley, CA (US);

Ban-Pak Wong, Milpitas, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method is provided for scan control and observation of a logical circuit that does not halt the operation of the system clock. Thus, all dynamic circuits within the system continue to evaluate and precharge normally. Moreover, the traditional method of placing a multiplexer before the data input of a clocked storage element to perform scan control and observation is no longer required. Consequently, the system and method provide a more efficient manner in which to perform scan control and observation of a logical circuit.


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