The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Mar. 10, 2003
Applicants:
Jonathan T. Stern, Round Rock, TX (US);
Marc D. Alexander, Cedar Park, TX (US);
Inventors:
Jonathan T. Stern, Round Rock, TX (US);
Marc D. Alexander, Cedar Park, TX (US);
Assignee:
Dell Products L.P., Round Rock, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method for reducing the amount of time for a boot operation is provided that includes a test management module that divides the memory into multiple test blocks and then selects a limited number of test blocks to test during a boot operation, thereby decreasing the overall amount of memory test time.
Stern, Jonathan. (2006). System and method for testing memory (U.S. Patent No. 7000159). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7000159
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile