The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
May. 08, 2001
Neil Latarche, San Jose, CA (US);
John Wang, San Jose, CA (US);
Neil Latarche, San Jose, CA (US);
John Wang, San Jose, CA (US);
Verity, Inc., Sunnyvale, CA (US);
Abstract
A method of parametric group processing includes forming a parametric index from an indexed database. A first parametric group and a second parametric group corresponding to elements in the parametric index are specified. The first parametric group and the second parametric group are merged to produce a merged parametric group. A parametric result is extracted from the merged parametric group, where the parametric result specifies a set of documents.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile