The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Apr. 26, 2002
Applicants:

Ryuta Ogawa, Moriguchi, JP;

Hiroaki Oka, Hirakata, JP;

Nobuhiko Ozaki, Ikoma, JP;

Hirokazu Sugihara, Katano, JP;

Inventors:

Ryuta Ogawa, Moriguchi, JP;

Hiroaki Oka, Hirakata, JP;

Nobuhiko Ozaki, Ikoma, JP;

Hirokazu Sugihara, Katano, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for extracting a signal of interest from a signal generated from at least one subject, comprises the steps of (A) obtaining a time-series signal generated from the subject as a data group consisting of a plurality of pieces of data, (B) obtaining a plurality of extracted data groups from the data group, wherein each extracted data group comprises a predetermined number of pieces of data selected from the data group, (C) calculating standard deviations of the plurality of extracted data groups to obtain a standard deviation group, and (D) referencing each standard deviation included in the standard deviation group and selecting the signal of interest.


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