The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Dec. 31, 2003
Karl L. King, Windsor, CO (US);
Ziyi Wang, Louisville, CO (US);
Dan J. Kroll, Fort Collins, CO (US);
Karl L. King, Windsor, CO (US);
Ziyi Wang, Louisville, CO (US);
Dan J. Kroll, Fort Collins, CO (US);
Hach Company, Loveland, CO (US);
Abstract
A process analysis system includes sensors and a processing system. The sensors monitor the process to generate sensor signals. The processing system processes the sensor signals to detect a deviation from a baseline for the process. The processing system generates a process vector for the deviation in response to detecting the deviation. The processing system compares the process vector to a plurality of library vectors to classify the deviation. In some examples, the process comprises a system that supplies water.