The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Mar. 21, 2003
Applicants:
Xin Guo, Mt. Kisco, NY (US);
Bonnie K. Ray, South Nyack, NY (US);
Inventors:
Xin Guo, Mt. Kisco, NY (US);
Bonnie K. Ray, South Nyack, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method (and structure) of optimizing a sampling period for a system having at least one measurable system parameter z, includes calculating a probability distribution function f(T). The time Tis a first time that the measurable system parameter z will reach a predetermined system threshold x, given level z.
Guo, Xin. (2006). Method and structure for dynamic sampling method in on-line process monitoring (U.S. Patent No. 6999895). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6999895
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile