The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Dec. 23, 2003
Applicants:

James Scott Dyer, Fort Collins, CO (US);

Jerry Ray Halterman, Fort Collins, CO (US);

Gerhard Josef Hunner, Fort Collins, CO (US);

George Bailey Muehlbach, Fort Collins, CO (US);

Inventors:

James Scott Dyer, Fort Collins, CO (US);

Jerry Ray Halterman, Fort Collins, CO (US);

Gerhard Josef Hunner, Fort Collins, CO (US);

George Bailey Muehlbach, Fort Collins, CO (US);

Assignee:

Deere & Company, Moline, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/60 (2006.01); G06F 169/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for evaluating crop performance obtains weather data for defined geographic locations within a geographic area. Historic soil data is obtained for the defined geographic locations within a geographic area. Historic yield data is obtained for the defined geographic area for a representative crop. Predictive data nodes are determined based on at least one of the obtained weather data, the historic soil data, and the historic yield data. Each node is associated with a certain range of average yields for a particular crop.


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