The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Jul. 17, 2002
Applicants:

Reiner Koppe, Hamburg, DE;

Erhard Paul Artur Klotz, Neumuenster, DE;

Johannes Catharina Antonius Op DE Beek, Eindhoven, NL;

Inventors:

Reiner Koppe, Hamburg, DE;

Erhard Paul Artur Klotz, Neumuenster, DE;

Johannes Catharina Antonius Op de Beek, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a device provide for the registration of two 3D image data sets of an object to be examined. The object to be examined is provided with a plurality of markers In order to enable a registration to be carried out, the positions of the markers in the 3D image data sets are first determined in a co-ordinate system associated with the relevant 3D image data set. The distances between the markers and/or the angles formed between lines which intersect in a marker and extend through two further markers are then determined. Finally, a transformation rule for the transformation of one of the 3D image data sets to the co-ordinate system of the other 3D image data set is determined.


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