The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
May. 05, 2003
Jerry Gene Williams, The Woodlands, TX (US);
David Barton Smith, Oak Ridge, TN (US);
Jeffrey David Muhs, Lenoir City, TN (US);
Jerry Gene Williams, The Woodlands, TX (US);
David Barton Smith, Oak Ridge, TN (US);
Jeffrey David Muhs, Lenoir City, TN (US);
Other;
Abstract
A method for the direct measurement of large strains in ropes in situ using a plastic optical fiber, for example, perfluorocarbon or polymethyl methacrylate and Optical Time-Domain Reflectometer or other light time-of-flight measurement instrumentation. Protective sheaths and guides are incorporated to protect the plastic optical fiber. In one embodiment, a small rope is braided around the plastic optical fiber to impose lateral compressive forces to restrain the plastic optical fiber from slipping and thus experience the same strain as the rope. Methods are described for making reflective interfaces along the length of the plastic optical fiber and to provide the capability to measure strain within discrete segments of the rope. Interpretation of the data allows one to calculate the accumulated strain at any point in time and to determine if the rope has experienced local damage.