The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Feb. 09, 2004
Applicant:
Xiangyang Tang, Waukesha, WI (US);
Inventor:
Xiangyang Tang, Waukesha, WI (US);
Assignee:
GE Medical Systems Global Technology, Waukesha, WI (US);
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for obtaining data useful for reconstructing an image of an object includes performing a cone beam helical Computed Tomography (CT) scan of an object to obtain projection data from a plurality of detector rows, and interpolating the obtained projection data to generate interpolated data along at least one curve that crosses at least two detector rows.