The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Apr. 30, 2003
Steve Horne, El Granada, CA (US);
Steve Horne, El Granada, CA (US);
Guide Technology, Inc., Sunnyvale, CA (US);
Abstract
A system and corresponding method for measuring relative timing of signal events in at least one measurement signal includes input circuitry for receiving such a measurement signal. The input circuitry may include a comparator configured to convert the measurement input signal into a binary timing signal that is indicative of selected transitions, or signal events, in the measurement signal. The original measurement signal, or subsequently generated timing signal, is then provided to signal splitting circuitry that is configured to split such signal a predetermined number of times and to generate a plurality of data streams whose frequency level is lower than the frequency level of the original measurement signal. The signal splitting circuitry may correspond to respective pluralities of edge-triggered devices, for example flip-flops, that are provided in a cascaded series of groups, and may in some embodiments further include a plurality of logic gates coupled between selected grouped pluralities of edge-triggered devices as well as delay elements coupled between selected inputs and outputs of the respective logic gates. Once the signal splitting circuitry generates a plurality of parallel data streams representative of the transition information in the original measurement input signal, such parallel data streams can then be relayed to one or more measurement channels such that time-stamped measurements of selected signal events can be obtained by interpolator-based measurement circuitry.