Semiconductor device capable of readjusting a reference potential during the reliabilty test

Abstract

A semiconductor device that generates a desired internal power supply by using, as a reference potential, a potential obtained by adjusting a preset standard potential, the semiconductor device comprises; a reference potential selection circuit selecting the reference potential on the basis of digital data from among a plurality of potentials of different levels which are obtained by dividing a power supply voltage, and outputting the reference potential instead of the standard potential; a first decision circuit deciding bits of the digital data; a second decision circuit deciding the bits of the digital data, separately from the first decision circuit; and a data transfer circuit transferring to the reference potential selection circuit the digital data which is decided by either one of the first and second decision circuits.