The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Dec. 12, 2003
Jong-yoon Kim, Yongin-si, KR;
Chang-dong Yeo, Yongin-si, KR;
Jong-Yoon Kim, Yongin-si, KR;
Chang-Dong Yeo, Yongin-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method of measuring the degree of thermal pole tip protrusion (TPTP) of a magnetic head and controlling a recording current in consideration of the degree of TPTP, in relation to a hard disk drive includes measuring the rate of errors contained in data by performing writing and reading operations while changing the level of an overshoot current (OSC), detecting a minimum error rate and a maximum error rate while changing a range of the OSC, and determining the degree of TPTP by measuring the difference between the minimum error rate and the error rate at the maximum OSC.