The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Sep. 22, 1999
Applicants:

Philip Andrew Westlake, Herts, GB;

Nigel Ingram Bromley, Bucks, GB;

Elaine Kathryn Stedman, Herts, GB;

Inventors:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of determining the location of an optical feature in an image projection system, the method comprising: 1) projecting a first image of the feature onto a detector with a lens in a first position; 2) sensing, with the detector, the position of the first image of the feature; 3) projecting a second image of the feature onto a detector with a lens in a second position laterally spaced from the first position; 4) sensing, with the detector, the position of the second image of the feature; and 5) deducing the location of the defect from the difference between the positions sensed in steps 2) and 4).


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