The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6999182 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 14, 2006

Filed:

Mar. 31, 2003
Applicant:

Simon Thibault, Sainte-Foy, CA;

Inventor:

Simon Thibault, Sainte-Foy, CA;

Assignee:

Institut National d'Optique, Sainte-Foy, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for characterizing an aspheric surface with respect to an expected shape thereof, comprising a light source to emit light of desirable properties. A ferrofluid deformable mirror apparatus has a reflective surface being controllably deformable. The reflective surface is shaped as a function of the expected shape so as to reflect light in a known path toward a detector. Optical elements project light from the light source onto the aspheric surface such that light is reflected along an expected path if the aspheric surface has the expected shape. Light is reflected from the aspheric surface along an actual path. The optical elements project light on the reflective surface of the ferrofluid deformable apparatus such that light is reflected along the known path. A detector receives light reflected along at least one of the actual path and the known path to obtain an interference pattern as a function of the expected path. Means are provided for interpreting the interference pattern so as to characterize the aspheric surface with respect to the expected shape.


Find Patent Forward Citations

Thibault, Simon. (2006). Method and system for characterizing aspheric surfaces of optical elements (U.S. Patent No. 6999182). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6999182

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