The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6999171 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 14, 2006

Filed:

Aug. 07, 2002
Applicant:

Hideo Kusuzawa, Kobe, JP;

Inventor:

Hideo Kusuzawa, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A particle size measuring apparatus includes a laser light source; a coherence reducing element for receiving laser light emitted by the laser light source, reducing coherence of the laser light and emitting the laser light whose coherence is reduced; a ring light forming section for converting the light emitted by the coherence reducing element into ring light; an internal reflection mirror for concentrating the ring light on a particle to be measured and illuminating the particle; an object lens for receiving scattered light from the illuminated particle inside the ring light; a photoreceptive element for receiving the scattered light through the object lens; and a calculating section for calculating a size of the particle from the intensity of the scattered light obtained by the photoreceptive element by using a monotone increasing function.


Find Patent Forward Citations

Kusuzawa, Hideo. (2006). Apparatus and method for measuring particle size (U.S. Patent No. 6999171). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6999171

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