The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Dec. 26, 2002
Yoshihiro Sanpei, Musashino, JP;
Makoto Komiyama, Musashino, JP;
Kenji Ogino, Musashino, JP;
Yasuyuki Suzuki, Musashino, JP;
Raiju Okada, Musashino, JP;
Shuuhei Okada, Musashino, JP;
Yoshihiro Sanpei, Musashino, JP;
Makoto Komiyama, Musashino, JP;
Kenji Ogino, Musashino, JP;
Yasuyuki Suzuki, Musashino, JP;
Raiju Okada, Musashino, JP;
Shuuhei Okada, Musashino, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
The present invention is intended to realize a spectrometer which improves the wavelength resolution without being affected by the pitch of the photodiode array. The present invention is characterized by a spectrometer which comprises a wavelength dispersion device spectrally dividing the measured light beam and a photodiode array composed of a plurality of photodiodes that detect the spectrally divided light beams by the wavelength dispersion device and output photocurrents, and performs measurement using the outputs of the photodiode array; providing a deflecting means that deflects the measured light beams and changes the position where the measured light beams are detected by the above photodiode array, and measuring the characteristics of the measured light beam from the measured results for different deflection amounts.