The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Aug. 25, 2004
Applicant:
Steven Nowlen Guilliams, San Francisco, CA (US);
Inventor:
Steven Nowlen Guilliams, San Francisco, CA (US);
Assignee:
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention discloses an electrical test probe having a side arm member attached to a main probe element at an angle less than 90 degrees. The length of the side arm is such that the end of the side arm does not make contact with surfaces being probed by the main probe tip. The side arm aids in the measurement of circuit component leads, pins and wires without causing short circuits when measuring closely spaced circuit board traces.