The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Mar. 11, 2003
Applicants:

Dzevat Omeragic, Sugar Land, TX (US);

Jacques R. Tabanou, Houston, TX (US);

Alain Dumont, Houston, TX (US);

Inventors:

Dzevat Omeragic, Sugar Land, TX (US);

Jacques R. Tabanou, Houston, TX (US);

Alain Dumont, Houston, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Transverse or tilted magnetic dipole antenna systems are used for electromagnetic logging measurements to determine the anisotropic resistivity of subsurface formations. Combined measurements between transverse or tilted antennas, as well as axial antennas, are used to compensate for receiver antenna mismatch in the system. Some embodiments use model-based parametric inversion to estimate the anisotropic resistivity in the presence of invasion and shoulder-bed effects.


Find Patent Forward Citations

Omeragic, Dzevat. (2006). Propagation based electromagnetic measurement of anisotropy using transverse or tilted magnetic dipoles (U.S. Patent No. 6998844). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6998844

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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