The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Aug. 29, 2003
Guangqiang Jiang, Castaic, CA (US);
Kate E. Purnell, Valencia, CA (US);
Gary D. Schnittgrund, Granada Hills, CA (US);
Joseph H. Schulman, Granada Hills, CA (US);
Guangqiang Jiang, Castaic, CA (US);
Kate E. Purnell, Valencia, CA (US);
Gary D. Schnittgrund, Granada Hills, CA (US);
Joseph H. Schulman, Granada Hills, CA (US);
Alfred E. Mann Foundation for Scientific Research, Santa Clarita, CA (US);
Abstract
The invention is a method of qualifying an implantable ceramic component made of high-purity dense yttria tetragonal zirconium oxide polycrystal (Y-TZP) by application of non-destructive tests. Specifically, a qualified Y-TZP ceramic component or witness sample is examined by X-ray diffraction to determine the initial monoclinic phase content. The component or witness sample is exposed to steam at 127° C. for a predetermined period of time, preferably six hours. The monoclinic phase content is determined for the post-exposure sample. The absolute difference between the initial monoclinic phase content and the post-exposure monoclinic phase content is calculated by difference. If the difference is less than 2.1% the sample is accepted. In an alternate embodiment, the components that pass the screening test are examined by ultrasonic testing to evaluate soundness of the ceramic component. Any component that presents a flaw of greater than three microns is rejected.