The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Mar. 05, 2003
Applicants:

James W. Wiff, Cologne, MN (US);

Jay. L. Hanson, Bloomington, MN (US);

Bill A. Carlson, Cottage Grove, MN (US);

Inventors:

James W. Wiff, Cologne, MN (US);

Jay. L. Hanson, Bloomington, MN (US);

Bill A. Carlson, Cottage Grove, MN (US);

Assignee:

Thermo King Corporation, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F25B 49/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods of diagnosing a temperature control unit and methods of performing a diagnostic check on a temperature control unit. The methods generally include monitoring at least one function of the temperature control unit, storing information relating to the at least one monitored function, determining from the information relating to the at least one monitored function whether the unit has a malfunction. Some methods generally include setting a flag to one of a first setting and a second setting, the flag being set to the first setting if the unit has no malfunction and the flag being set to the second setting if the unit has at least one malfunction, and enabling the diagnostic check when the flag is set to the first setting. Some methods generally include enabling at least one of a first diagnostic check and a second diagnostic check on the unit, the first diagnostic check being enabled if the unit has no malfunction and the second diagnostic check being enabled whether the unit has no malfunction or at least one malfunction, wherein the first diagnostic check consumes a shorter period of time to successfully complete than the second diagnostic check.


Find Patent Forward Citations

Loading…