The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2006

Filed:

May. 31, 2001
Applicants:

Lawrence J. Choi, Lawrenceville, NJ (US);

Christopher B. Kuenne, Princeton, NJ (US);

Kurt E. Holstein, Ii, Princeton, NJ (US);

Henry Andrew Cross, Moorestown, NJ (US);

Jason R. Whitney, New York, NY (US);

George Tang, New York, NY (US);

Chetna Bansal, New York, NY (US);

Joshua D. Babbitt, Jersey City, NJ (US);

Inventors:

Lawrence J. Choi, Lawrenceville, NJ (US);

Christopher B. Kuenne, Princeton, NJ (US);

Kurt E. Holstein, II, Princeton, NJ (US);

Henry Andrew Cross, Moorestown, NJ (US);

Jason R. Whitney, New York, NY (US);

George Tang, New York, NY (US);

Chetna Bansal, New York, NY (US);

Joshua D. Babbitt, Jersey City, NJ (US);

Assignee:

RMSG LLC, Princeton, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Exemplary embodiments provide a computer-assisted method for typing customers/prospects, including the activities of: refining a survey via bestfit clustering; refining survey results via composition analysis; and identifying clusters of customers/prospects from the survey results via champion/challenger cluster refinement and panel analysis.


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