The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2006
Filed:
Oct. 06, 2003
John Michael Hauck, Bridgman, MI (US);
David Andrew Barfoot, St. Joseph, MI (US);
John Michael Hauck, Bridgman, MI (US);
David Andrew Barfoot, St. Joseph, MI (US);
Leco Corporation, St. Joseph, MI (US);
Abstract
An indentation hardness test system includes a frame having a movable turret, a movable stage for receiving a part, a camera, a display, a processor and a memory subsystem. The turret includes an objective lens of a microscope and an indenter and the movable stage is configured for receiving the part to be tested. The camera captures images of the part through the microscope, which can then be provided on the display. The processor is coupled to the turret, the movable stage, the camera and the display, as well as the memory subsystem. The memory subsystem stores executable code that instructs the processor to capture and store a series of real-time images of the part using the camera, store associated stage coordinates provided by the stage for the images and display a composite image, which includes the series of real-time images assembled according to the associated stage coordinates, of the part.