The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2006
Filed:
Apr. 12, 2004
Jiang Hsieh, Brookfield, WI (US);
Jean-baptiste Thibault, Milwaukee, WI (US);
Fang Frank Dong, Waukesha, WI (US);
Jian Ying LI, New Berlin, WI (US);
Edward Chao, Oconomowoc, WI (US);
Scott Matt Mcolash, Wauwatosa, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Jean-Baptiste Thibault, Milwaukee, WI (US);
Fang Frank Dong, Waukesha, WI (US);
Jian ying Li, New Berlin, WI (US);
Edward Chao, Oconomowoc, WI (US);
Scott Matt McOlash, Wauwatosa, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for performing reference normalization for an image created by an imaging system. The imaging system includes a radiation detector array with a right and left edge. The method includes receiving a projection dataset created by the imaging system in response to a varying x-ray tube current. The projection dataset includes a view and predicted fluxes are calculated for the set of reference channels within the view. A right set of reference channels are located proximate at the right edge of the detector array and a left set of reference channels are located proximate to the left edge of the detector array. The method also includes calculating average actual fluxes for the sets of reference channels. Based on the predicted reference fluxes and the average fluxes, a reference correction value for the view is determined. The correction value is applied for the reference correction of the view.