The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2006
Filed:
Oct. 27, 2003
Applicants:
Hau-wei Wang, Taipei, TW;
Spring Ying-cheun Yeh, Pingjen, TW;
Chun-hung Ko, Changhua, TW;
Inventors:
Assignee:
Industrial Technology Research Institute, Hsinchu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscopic imaging apparatus with flat-top distribution of light is disclosed, which includes an incident light source, a diffractive optical element, a beam-splitter, a tunable filter and an image sensor. The diffractive optical element receives an incident light provided by the incident light source and generates a uniform incident light. The uniform incident light illuminates a sample so that an optical signal is emitted from the sample. The optical signal passes through the beam-splitter and the filter unit to reach the image sensor for obtaining the detected image of the sample.