The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6995901 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 07, 2006

Filed:

Jan. 15, 2004
Applicant:

David M. Heffelfinger, Sequim, WA (US);

Inventor:

David M. Heffelfinger, Sequim, WA (US);

Assignee:

Alpha Innotech Corporation, San Leandro, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for the optical analysis of a sample. An illumination source illuminates the sample, exciting fluorescence. The fluorescence is collected by an objective lens, which transmits the collected illumination light onto an imaging lens, which focuses the collected light onto an area array detector. Collected light rays between the objective lens and the imaging lens are parallel and pass through an emission filter. Both the objective lens and the imaging lens are positioned on a mount that allows an alternative objective or imaging lens to be positioned to collect or image the emitted light. Any objective lens/imaging lens pair is optically symmetrical, greatly reducing the optically degrading effects.


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