The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2006

Filed:

Jan. 16, 2003
Applicants:

Peter Lysyansky, Haifa, IL;

Dan Rappaport, Haifa, IL;

Inventors:

Peter Lysyansky, Haifa, IL;

Dan Rappaport, Haifa, IL;

Assignee:

GE Ultrasound Israel, LTD, Turat-Hacarmel, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus for assessing tissue motion and deformation is provided. Sequential frames of data representative of tissue are accessed. A region of interest is defined on a current frame of data, and first locations of a set of features within the region of interest is identified. Each feature in the set of features identifies a location within the tissue. Second locations of the set of features are located on a consecutive frame of data. Velocity vectors are calculated based on the first and second locations of the set of features, and a continuous spatial and temporal velocity distribution is reconstructed by fitting the velocity vectors. The region of interest is modified on the consecutive frame based on the velocity distribution to follow motion and deformation of the tissue.


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