The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2006
Filed:
Jun. 24, 2003
Jorge L. Acosta, Eugene, OR (US);
Jorge L. Acosta, Eugene, OR (US);
PSC Scanning, Inc., Eugene, OR (US);
Abstract
A method of and a system for generating a dense pattern of scan lines. In a preferred configuration, a laser beam is directed into an inline beam dithering mechanism which dithers the beam over an angle parallel to the axis of rotation of the rotating facet wheel. The combination of the dithering mechanism and the scanning motion of the rotating facet wheel creates a dense scan pattern. Return light is retrodirectively collected and by a collection element such as a collection lens onto a detector. A beam redirector such as a cone-shaped device having openings on both ends and a reflecting internal surface is disposed between the collection lens and the detector to redirect off-axis spot onto the detector. The system and method is applicable to both single and multiple beam systems and single and multiple window scanners.