The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2006
Filed:
Oct. 08, 2003
Juan Andres Chavarria, Durham, NC (US);
Partha Sarathi Routh, Boise, ID (US);
Jerry Lee Kisabeth, Ponca City, OK (US);
Gregory Joseph Jorgensen, Ponca City, OK (US);
Juan Andres Chavarria, Durham, NC (US);
Partha Sarathi Routh, Boise, ID (US);
Jerry Lee Kisabeth, Ponca City, OK (US);
Gregory Joseph Jorgensen, Ponca City, OK (US);
ConocoPhillips Company, Houston, TX (US);
Abstract
The present invention is a method for determining a parameter of interest of a region of interest of the earth. At least one component of potential fields data is measured at a plurality of locations over a region of interest including a subterranean formation of interest. The potential fields data are selected from magnetic data and gravity data. An initial geophysical model is determined for the region including the subterranean formation of interest. For the model, geophysical tensor data is updated using a forward model at a plurality of locations using a High Order Compact Finite Difference method. A difference between the estimated model value and the measured value of the potential field measurements are determined, and the geophysical model is updated. The model is iteratively updated and compared to the measured data until the differences reach an acceptable level and the parameter of interest has been determined.