The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2006
Filed:
Jan. 22, 2002
Mitchell A. Buznitsky, Carlsbad, CA (US);
Yuqian Cedric Wong, San Diego, CA (US);
Daniel C. Bozich, San Diego, CA (US);
Brima B. Ibrahim, Los Angeles, CA (US);
Mitchell A. Buznitsky, Carlsbad, CA (US);
Yuqian Cedric Wong, San Diego, CA (US);
Daniel C. Bozich, San Diego, CA (US);
Brima B. Ibrahim, Los Angeles, CA (US);
Broadcom Corporation, Irvine, CA (US);
Abstract
Determination and processing for fractional-N programming values. The present invention is operable to receive a clock signal (CLK) and to transform that CLK into a new CLK, when necessary, for use by various circuitries within a system. The present invention is operable to generate two different CLKs for use by a radio frequency (RF) circuitry and a baseband processing circuitry in certain embodiments. The present invention employs a measurement circuitry and to characterize a first CLK and uses a fractional-N synthesizer to perform any necessary processing to generate the one or more CLKs to the other CLKs within the system. The first CLK may be received from an external source or it may be generated internally; in either case, the present invention is able to modify the CLK into another CLK for use by other circuitries within the system or for use by another external device.