The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2006

Filed:

May. 30, 2001
Applicant:

Yohji Nakamura, Atsugi, JP;

Inventor:

Yohji Nakamura, Atsugi, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus used to detect errors in image reading simply and quickly. Information derived from image data (such as the amount of data and a compression ratio) after compression is compared with reference values previously determined in connection with errors in image reading, and the existence of errors in image reading is determined. When the data size is used, it is judged that there is an error in image reading when the data size after compression is smaller than the reference value previously determined. When the compression ratio of the image data is used, it is judged that there is an error of image reading in the case where the compression ratio is larger than the reference value previously determined.


Find Patent Forward Citations

Nakamura, Yohji. (2006). Method and apparatus for detecting errors in image reading (U.S. Patent No. 6993194). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6993194

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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