The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2006
Filed:
Jun. 29, 2001
Scott D. Connell, Saratoga, CA (US);
Herbert F. Cattell, Mountain View, CA (US);
Glenda C. Delenstarr, Belmont, CA (US);
Nicholas M Sampas, San Jose, CA (US);
Andreas N. Dorsel, Menlo Park, CA (US);
Scott D. Connell, Saratoga, CA (US);
Herbert F. Cattell, Mountain View, CA (US);
Glenda C. Delenstarr, Belmont, CA (US);
Nicholas M Sampas, San Jose, CA (US);
Andreas N. Dorsel, Menlo Park, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A method and system for employing pixel-based, signal-intensity data contained within areas of a scanned image of a molecular array corresponding to features and feature backgrounds in order to determine whether or not the features or feature backgrounds have non-uniform signal intensities and are thus outlier features and outlier feature backgrounds. A calculated, estimated variance for the signal intensities within a feature or feature background is compared to a maximum allowable variance calculated for the feature or feature background based on a signal intensity variance model. When the experimental variance is less than or equal to the maximum allowable variance, the feature or feature background is considered to have acceptable signal-intensity uniformity. Otherwise, the feature or feature background is flagged as an outlier feature or outlier feature background.