The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2006
Filed:
Jan. 07, 2002
Peter C. Johnson, Pittsburgh, PA (US);
Mary Del Brady, Pittsburgh, PA (US);
Michael G. Fuhrman, Pittsburgh, PA (US);
Othman A. Abdul-karim, Pittsburgh, PA (US);
Sujal Shah, Pittsburgh, PA (US);
Peter C. Johnson, Pittsburgh, PA (US);
Mary Del Brady, Pittsburgh, PA (US);
Michael G. Fuhrman, Pittsburgh, PA (US);
Othman A. Abdul-Karim, Pittsburgh, PA (US);
Sujal Shah, Pittsburgh, PA (US);
Icoria, Inc., Research Triangle Park, NC (US);
Abstract
We disclose quantitative geometrical analysis enabling the measurement of several features of images of tissues including perimeter, area, and other metrics. Automation of feature extraction creates a high throughput capability that enables analysis of serial sections for more accurate measurement of tissue dimensions. Measurement results are input into a relational database where they can be statistically analyzed and compared across studies. As part of the integrated process, results are also imprinted on the images themselves to facilitate auditing of the results. The analysis is fast, repeatable and accurate while allowing the pathologist to control the measurement process.