The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2006

Filed:

Feb. 17, 2005
Applicant:

Martin Annis, Cambridge, MA (US);

Inventor:

Martin Annis, Cambridge, MA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for reducing blurring caused by transverse movement of an object being inspected relative to the x-ray source/detector array assembly. The plane of the scanning fan beam plane generated by the x-ray source is tilted by an angle relative to the plane that is perpendicular to the direction of motion of the object by an angle such that the fan beam source traverses distance D parallel to the direction of motion of the object in the same amount of time as one scan of the fan beam.


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