The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2006
Filed:
Mar. 18, 2003
Hiroyuki Okada, Toyama, JP;
Miki Shibata, Takaoka, JP;
Tadahiro Echigo, Uozu, JP;
Shigeki Naka, Nei-gun, JP;
Hiroyoshi Onnagawa, Toyama, JP;
Hiroyuki Okada, Toyama, JP;
Miki Shibata, Takaoka, JP;
Tadahiro Echigo, Uozu, JP;
Shigeki Naka, Nei-gun, JP;
Hiroyoshi Onnagawa, Toyama, JP;
President of Toyama University, Toyama, JP;
Abstract
A method for measuring a relative thickness distribution of an organic thin film for use in an organic electroluminescence device comprises the steps of irradiating a predetermined region of the organic thin film with a light including an ultraviolet light, measuring the intensity of a fluorescence produced by the organic thin film in response to the light irradiation, and obtaining a film thickness of the predetermined region from the intensity of the fluorescence. Further, an apparatus for measuring a thickness distribution for use in an organic electroluminescence device has means for irradiating a predetermined region of the organic thin film with a light including an ultraviolet light, means for measuring the intensity of a fluorescence produced by the organic thin film, and means for obtaining the film thickness of the predetermined region from the intensity of the fluorescence.